UJ3N120070K3S Discrete TO Packaged SiC JFETs AEC-Q101 Product Qualification Report
This report summarizes the AEC-Q101 qualification results for United Silicon Carbide, Inc.’s UJ3N family of Discrete SiC JFETs in TO-247-3L plastic packages.
The environmental stress tests listed below are performed with pre-stress and post-stress electrical tests. Reviewing the electrical results for new failures and any significant shift performance satisfies the AEC-Q101 qualification requirements, as well as UnitedSiC’s Quality requirements.
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UJ3N120070K3S 、 UJ3N120035K3S 、 UJ3N065080K3S 、 UJ3N065025K3S 、 UJ3N |
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Test Report |
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Please see the document for details |
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TO-247-3L |
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English Chinese Chinese and English Japanese |
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2020/04/16 |
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456 KB |
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