TSMC FAB 6 FINISHED WAFER CE/2018/C4084 SGS Test Report
●The following samples was/were submitted andidentified by/on behalf of the client as:
■Sample Submitted By:TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
■Sample Description:TSMC FAB 6 FINISHED WAFER
■Test Requested:
◆As specified by client, with reference to RoHS 2011/65/EU Annex II and amending Directive (EU) 2015/863 to determine Cadmium, Lead, Mercury, Cr(VI), PBBs, PBDEs, DBP, BBP, DEHP, DIBP contents in the submitted sample.
◆Please refer to next pages for the other item(s).
■Conclusion: Based on the performed tests on submitted samples, the test results of Cadmium, Lead, Mercury, Cr(VI), PBBs,PBDEs, DBP, BBP, DEHP, DIBP comply with the limits as set by RoHS and amending Directive (EU) 2015/863.
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2018/12/28 |
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CE/2018/C4084 |
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1.1 MB |
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