A Systematic Approach for Testing Todays Power Semiconductors to obtain a generally applicable characterization

PublishTime：2022-04-20

Abstract: New characterization and testing methods have been developed with respect to the state of the art in power semiconductors. Their knowledge and use is decisive for reliable and efficient simulation and design of power electronic converters. This paper shows principles of characterization in a systematic approach. Their meaning for com-ponent applications is derived. Furtherly testing methods to gain the required data are derived. Testers recently developed for characterization and quality assurance measure-ments and results obtained with them are presented. Thus this paper shows the links between characterization, testing and application for fast switching power semiconduc-tors. It focusses on insulated gate bipolar transistors (IGBT) as typical devices of this type.

Brand of Product：	IXYS
Part#：
Product Category：	POWER SEMICONDUCTORS 、 fast switching power semiconductors 、 insulated gate bipolar transistors (IGBT) 、 Testers More
Application：	More
Data Type：	Application note & Design Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	2017/11/18
Version Number：
Data Encoding：	IXAN0046
Data Size：	944 KB

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