Si117x/8x Errata
This document contains information on the errata of Si117x/8x. The latest available revision of this device is revision B3.
For errata on older revisions, please refer to the errata history section for the device. The revision information is specified in theREV_ID register or near the trace code on the device. Refer to the package marking information in the data sheet for more information.
Detailed Errata Descriptions:
●RMU_E101—Restriction on VDD Ramp Time
●RMU_E102—Brownout During Measurement Causes Lockup
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Errata |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2018/12/08 |
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Rev. 0.2 |
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538 KB |
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