What is Accelerated Life Testing
What is "Accelerated Life Testing"?
Accelerated life testing (ALT) is a testing method that predicts the lifetime characteristics of a product under a normal stress level in a short period of time by increasing the stress and combining it with statistical models related to physical failure laws.
Common Accelerated Life Test Types
Significance of Accelerated Life Testing
ALT can shorten the life test cycle.
Test results can be used to evaluate the reliability of electronic products and formulate the basis
Combined with failure analysis, ALT can find the shortcomings of reliability failures.
Commonly Used Accelerated Stresses
Stress in accelerated testing is a broad concept that includes all conditions that affect a product's lifespan. Commonly used stresses include:
Thermal stress (e.g., temperature)
Electrical stress (e.g., voltage, current, power)
Moisture stress (e.g., humidity)
Chemical environment (e.g., gas concentration, salinity)
Mechanical stress (e.g., vibration, friction, pressure, load, frequency)
Radiation
Censoring Life Testing
Definition: An experimental method wherein an object is tested until a partial failure occurs and the complete life distribution is derived by a statistical analysis of the known failure data.
Classification: Type-I censoring life test and Type-Ⅱ censoring life test
Significance: Shortened testing time
- +1 Like
- Add to Favorites
Recommend
- Novusem Certified as a High-tech Enterprise Providing Comprehensive Application Solutions in Wide Fields
- Novusem Signs Long-term Strategic Cooperation Agreement with Taiwan‘s Episil Further Deepening the Partnership in SiC Manufacturing
- Novusem SiC MOSFET Product with High Cost Performance and High Reliability, Meeting the Application Needs of New Energy Vehicles
- The Encyclopedia of SiC丨SiC Crystal
- Keysight Expands Novus Portfolio with Compact Network Test Solution for Automotive and Industrial IoT
- Novus Labs‘ test report on 100 routers shows RS9116 Robust low-power Wi-Fi Interoperability
- Keysight, Telefonica Join Forces to Advance Transport Networks for Open RAN Deployments
- Keysight’s Participation in O-RAN Global PlugFest Spring 2022 Enables Ecosystem to Speed Open RAN Technology Development and Specifications Maturity
This document is provided by Sekorm Platform for VIP exclusive service. The copyright is owned by Sekorm. Without authorization, any medias, websites or individual are not allowed to reprint. When authorizing the reprint, the link of www.sekorm.com must be indicated.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
