Model 251 I-V Test Software
●Model 251 Addendum
■INTRODUCTION
▲This addendum to the Model 251 Instruction Manual is being provided to supply you with the latest information in the least possible time. Please incorporate the following information into the manual.
●FEATURES
■Model 251 I-V Test Software is a program that controls a system of instruments designed to measure I-V characteristics of semiconductors. Model 251 can be configured to support the following instruments:
▲Model 236/237/238 Source Measure Units e
▲Model 2361 Trigger Controller
▲Model 213 Quad Voltage Source
▲Model 707 Switching Matrix
■Other Keithley and non-Keithley instruments are supported with user-programmed device-dependent commands.
■Key Model 231 features include:
▲The menu-driven software allows easy data collection of parameters from semiconductors and other components.
▲The data is displayed on the computer monitor and can be printed or plotted on a hardcopy peripheral.
▲Graphical analysis capabilities include markers, line slope, zooming, and smoothing.
▲A library of tests is included for resistors, capacitors, diodes, bipolar transistors, and FETS. Test setup and sample data files are included on disk.
▲A test sequencing procedure lets you chain multiple tests without operator interventions.
▲Full Model 213 support provides an easy method of interfacing a four-channel voltage bias source.
▲Model 707 support for uploading and downloading of up to 100 setups expands the capability to run multiple tests on multiple devices.
▲The Model 2361 Trigger Controller that is available simplifies trigger connections and optimizes trigger response times among the source measure units.
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User's Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2018/07/05 |
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Rev. B |
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22.9 MB |
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