Benefits of De-embedding and Match-Corrected Measurements

PublishTime：2025-03-15

This application note discusses the importance of minimizing uncertainty in measurement setups for wireless communication technologies. It explains the challenges of measuring devices under test (DUT) while excluding the impact of test fixtures. The note covers the concepts of incident and reflected waves, path loss, frequency response, and impedance mismatch. It also discusses the impact of these factors on measurement results and introduces the use of de-embedding, ALC, and reflectometers to correct these issues. The note highlights the benefits of match-corrected signal generation and introduces the N5186A MXG signal generator from Keysight, which features an embedded reflectometer for improved measurement accuracy.

Brand of Product：	Keysight
Part#：	N5186A MXG More Part#
Product Category：	Signal Generators More
Application：	[ Wireless communication ][ measurement setups ][ device under test (DUT) characterization ] More
Data Type：	Application note & Design Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	November 1, 2023
Version Number：
Data Encoding：	3123-1844.EN
Data Size：	1 MB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 6 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits