GERMANIUM PHOTODIODE RELIABILITY ANALYSIS

PublishTime：2024-12-05

Germanium photodiodes (PIN's and APD's) produced by Teledyne Judson Technologies have demonstrated excellent reliability in life testing programs. This is shown by the fact that no failures have occurred in almost 8000 hours of accelerated testing. The determination of median life is shown to exceed 3000 years and random failure rate is much less than 1 FIT at 25°C. (1 FIT means one failure in 1E9 device-hours.) Since no actual failure distribution nor activation energy for Ge photodiodes have ever been reported in the literature, we use the well-accepted Bellcore Report as a guide to proceed with our reliability analysis. Listed below are pertinent information and a description of the methods and calculations used to determine the median life and random failure rates for Teledyne Judson's Ge photodiodes.

Brand of Product：	TELEDYNE JUDSON TECHNOLOGIES
Part#：
Product Category：	GERMANIUM PHOTODIODE More
Application：	More
Data Type：	User's Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	December 2002
Version Number：
Data Encoding：	PB 4200
Data Size：	5.1 MB

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