SPA-100 Swept Photonics Analyzer
●The complete system employs OFDR (Optical Frequency Domain Reflectometry) technology enabling it to analyze the back reflection and transmission characteristics of fiber optic devices/ components in the spatial domain. The system produces a trace like an OTDR (Optical Time Domain Reflectometer), but with much higher resolution and precision. The system has a sampling resolution of 5 μm allowing it to discern structures within PIC and silicon photonic (SiPh) devices with ease.
●The system is available in two configurations: O-band (1260 nm to 1350 nm) and CL band (1480 nm to 1640 nm).
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[ Analysis of silicon photonic waveguides ][ Automated SiPh wafer alignment ][ Optical component reflectance and analysis ][ Wavelength dependent component characterization ][ Fiber optic connector and cable assembly mating analysis ][ High resolution reflectance analysis and length measurement ] |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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202309 |
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Ver.1.4 |
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SPA-100-C-E |
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773 KB |
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