Keithley Probe Cards
■Accuprobe can now manufacture and offer to Keithley customers probe card assemblies for the S400, 600 and 900 Parametric Test Systems. A full range of probe cards including Ceramic Blade, Epoxy-Ring, and Coax- Epoxy can be supplied. Customers are assured that critical parametric measurements necessary for superior wafer test yield are obtainable with the Keithley and Accuprobe combination.
■The probe cards are assembled, cleaned and tested to tightly controlled specifications as outlined in the Keithley Engineering Manuals. Probe card failures can occur from a contaminated card. Careful handling in manufacturing helps to maintain the probe card’s very low leak- age characteristics, and the use of vapor degreasers ensures that all manufacturing process contamination is removed from the card. Leakage testing, using Keithley programmable electrometers, is used to verify the card’s continuity and leakage characteristics. Probe card ID chips may be installed as part of the manufacturing process.
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Probe Cards 、 probe card assemblies 、 Ceramic Blade probe cards 、 EPOXY RING CARDS 、 Coax-Epoxy probe card 、 Epoxy-Ring probe card |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2002/8/6 |
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590 KB |
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