Model 102C/CE Edge Profile Comparator
●The Model 102C/CE Edge Profile Comporator non-destructively inspects semiconductor vwafer edges and significantly improves yield, reduces wafer breokoge, and increoses equipment uptime.
■Reduces chipping and fracture
■Improves gripping by wofer handlers
■Preserves valuable materials
■Increases yield
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102C 、 102CE 、 Model 102C 、 Model 102CE |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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09/18/2021 |
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9200-1005 |
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569 KB |
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