THz-Raman – Accessing molecular structure with Raman spectroscopy for enhanced chemical identification, analysis and monitoring
●Structural analysis via spectroscopic measurement of rotational and vibrational modes is of increasing interest for many applications, since these spectra can reveal unique and important structural and behavioral information about a wide range of materials. However these modes correspond to very low frequency (~5cm-1 - 200cm-1, or 150 GHz-6 THz) emissions, which have been traditionally difficult and/or expensive to access through conventional Raman and Terahertz spectroscopy techniques. We report on a new, inexpensive, and highly efficient approach to gathering ultra-low- frequency Stokes and anti-Stokes Raman spectra (referred to a “THz-Raman”) on a broad range of materials, opening potential new applications and analytical tools for chemical and trace detection, identification, and forensics analysis. Results are presented on explosives, pharmaceuticals, and common elements that show strong THz-Raman spectra, leading to clear discrimination of polymorphs, and improved sensitivity and reliability for chemical identification.
■CONCLUSIONS
●The addition of low-frequency/THz-Raman signals to traditional Raman spectra can boost the sensitivity and significantly enhance the forensic value of Raman spectroscopy for a wide range of applications, including polymorph identification, explosives trace detection, polymer and industrial chemical development and manufacture, material science, and forensics analysis. VHG-enabled THz-Raman systems are compact, efficient, and add a wealth of information regarding the physical structure of the molecule in addition to chemical composition. These new platforms greatly simplify the use and lower the cost of exploiting the many benefits of low-frequency Raman spectroscopy.
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[ polymorph identification ][ explosives trace detection ][ chemical analysis ][ identification ][ monitoring ][ forensics ][ contamination applications ][ polymer ][ chemical identification ][ industrial chemical ][ material science ][ forensics analysis ] |
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Technical Documentation |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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May 29, 2013 |
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10.1117/12.2018136 |
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928 KB |
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