Supplementary explanation on RAM self-test
This is a supplementary explanation for customers who perform RAM self-tests to achieve functional safety or for any other purposes while a MCU is operating.
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PCN/EOL |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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Dec. 20, 2016 |
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Rev.1.00 |
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TN-H8*-A440A/E |
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263 KB |
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