TSOT23-6 Semiconductor Device (RoHS) TEST REPORT(WTH23H03063188R1C)
●Sample Name: Semiconductor Device
●Sample Model: TSOT23-6
●Test Requested
■As specified by client, to determine the Pb, Cd, Hg, Cr(VI), PBBs, PBDEs, DBP, BBP, DEHP, DIBP content in the sample with reference to EU RoHS Directive 2011/65/EU and its amendment Directive EU 2015/863.
▲Test Conclusion:PASS
●Test Result(s):
■Test Method/Equipment: IEC 62321-5:2013,IEC 62321-4:2013+AMD1:2017,IEC 62321-7-2:2017,IEC 62321-7-1:2015,IEC 62321-6:2015,IEC 62321-8:2017; ICP-OES/AAS,UV-VIS,GC-MS
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Test Report |
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Please see the document for details |
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TSOT23-6 |
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English Chinese Chinese and English Japanese |
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2023-4-1 |
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WTH23H03063188R1C |
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1005 KB |
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