Power MOS FET・IGBT Attention of Handling Semiconductor Devices
●Semiconductor devices reliability is remarkably affected by using conditions such as electronic circuits, mounting, environments, etc. In order to keep high reliability of our semiconductor devices for customer’s use important hints on selecting the maximum rating, derating, and device package are explained in this chapter.
■ Maximum Ratings
●The maximum ratings of a semiconductor device are usually defined by the “absolute maximum ratings” and can not be exceeded in any circumstances, even momentarily.
●If a device operates in excess of the absolute maximum ratings, even momentarily, the device may immediately be degraded or broken. Even if it goes on operating, its lifetime should be considerably reduced. Therefore, in designing an electronic circuit using semiconductor devices, it is necessary to consider that the maximum ratings of devices shouldn’t be exceeded under any changes of external conditions. Furthermore, it should be noted that most of ratings are closely related to each other and ratings are not always allowed at the same time. For example, even if a current and a voltage applied to a transistor are individually within their maximum ratings, the collector dissipation should also be kept within the maximum rating at the same time, because power consumption is the product of current and voltage. In addition to maximum D.C. ratings, it is necessary to consider ratings of SOA, peak voltage, and peak current when devices are used in pulse condition.
■ Consideration about Derating
●It is a very important matter for high reliable design to decide the degree of derating from the maximum ratings. Derating of RENESAS semiconductor devices are already mentioned. Here it is noted that the derating items during system design, depending on the semiconductor device are electrical stress (voltage, current, power, load) environmental stress (temperature, humidity) and mechanical stress (vibration, shock).
●Table 1 shows some examples of derating standards to be used for reliability designs.
●Items for junction temperature are assumed that the overnight continuous operation. Furthermore, the values in “( )” is the value of assuming the intermittent operation for about three hours a day.
●It is should be considered these derating standards from the design phase of the equipment for ensure reliability. When it is difficult to setting the rated value within the derating standards, it is necessary to another means such as selecting a device of larger absolute maximum rating.
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Application note & Design Guide |
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Please see the document for details |
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TO-220AB;TO-3P;TO-3PL;TO-3PSG;TO-247;TO-220FM;TO-220CFM;TO-220FN;TO-220FL;TO-220FP;TO-3PFM;TO-3PF;TO-3PFP;TO-247plus |
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English Chinese Chinese and English Japanese |
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Apr 16, 2021 |
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Rev.6.02 |
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R07ZZ0010EJ0602 |
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1 MB |
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