How To Measure OIT/OOT with Chip DSC
■This manual is a short description of how to measure Oxidation Onset Temperature (OOT) and Oxidation Induction Time (OIT) with Chip DSC. These measurements are used to evaluate the oxidation stability of plastic samples and the specifics are covered in more detail in the ISO 11357-6. Generally speaking, the OOT approach measures the temperature when oxidation starts to occur at a specific heating rate, whereas the QIT approach measures the time when oxidations starts to occur at an isothermal condition. The Chip DSC is well suited for both of these types of investigations.
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User's Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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08.09.2020 |
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882 KB |
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