M14D5121632A (2A) Operation Temperature Condition (TC) -40°C~105°C 8M x 16 Bit x 4 Banks DDR II SDRAM
●Features
■JEDEC Standard
■VDD= 1.8V ±0.1V, VDDQ= 1.8V ±0.1V
■Internal pipelined double-data-rate architecture; two data access per clock cycle
■Bi-directional differential data strobe(DQS,DQS); DQS can be disabled for single-ended data strobe operation.
■On-chip DLL
■Differential clock inputs (CLK and CLK)
■DLL aligns DQ and DQS transition with CLK transition
■Quad bank operation
■CAS Latency : 3, 4, 5, 6, 7, 8, 9
■Additive Latency: 0, 1, 2, 3, 4, 5, 6, 7
■Burst Type : Sequential and Interleave
■Burst Length : 4, 8
■All inputs except data & DM are sampled at the rising edge of the system clock(CLK)
■Data I/O transitions on both edges of data strobe (DQS)
■DQS is edge-aligned with data for READ; center-aligned with data for WRITE
■Data mask (DM) for write masking only
■Off-Chip-Driver (OCD) impedance adjustment
■On-Die-Termination for better signal quality
■Special function support
▲50/ 75/ 150 ohm ODT
▲High Temperature Self refresh rate enable
▲Duty Cycle Corrector
▲Partial Array Self Refresh (PASR)
■Auto & Self refresh
■Refresh cycle :
▲8192 cycles/64ms(7.8μs refresh interval) at -40°C ≦ TC ≦ +85°C
▲8192 cycles/32ms(3.9μs refresh interval) at +85°C<TC ≦ +105°C
■SSTL_18interface
■If tCK< 1.875ns, the device can not support Write with Auto Precharge function
M14D5121632A -1.5BIAG2A 、 M14D5121632A -1.8BIAG2A 、 M14D5121632A -2.5BIAG2A 、 M14D5121632A -1.8BBIAG2A 、 M14D5121632A -2.5BBIAG2A 、 M14D5121632A |
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Datasheet |
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Please see the document for details |
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84 ball BGA |
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English Chinese Chinese and English Japanese |
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Oct.2016 |
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Revision:1.0 |
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2 MB |
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