Reliability Qualification Report for DDRIIIL SDRAM with Pb/Halogen Free (Industrial) (512M×16, 25nm SDRAM AS4C512M16D3LC-10BIN)
●In order to meet the most stringent market demands for high quality and reliability semiconductor components, Alliance maintains a strict reliability program in all products. The purpose of this report is to give an overview of the reliability status of AS4C512M16D3LC-10BIN. Accelerated tests are performed on product, and then the results are extrapolated to standard operating conditions in order to calculate and estimate the component’s failure rate.
■CONCLUSION:
●Reliability test is to ensure the ability of a product in order to perform a required function under specific conditions for a certain period of time. Through those tests, the devices of potential failure can be screened out before shipping to the customer. At the same time, the test results are fed back to process, design and other related departments for improving product quality and reliability.
●According to the life time test data, the short-term 48Hrs failure rate (= the normal operation 0-1 year) of AS4C512M16D3LC-10BIN is equal to 0 DPM at Ta=55°C and Vcc=1.35V with 60% confidence level AND the long-term 1000Hrs failure rate (= the normal operation 1-10 year) of AS4C512M16D3LC-10BIN is equal to 30 FIT at Ta=55°C and Vcc=1.35V with 60% confidence level. The results of environmental test, ESD test and latch-up test also ensure that AS4C512M16D3LC-10BIN is manufactured under a precise control of quality work by Alliance and its subcontractors. Thus, this experiment based on the Alliance reliability test standard for above test items can all pass.
●With the extensive research and development activities and the cooperation of all departments, Alliance continuously sets and maintains higher standard of quality and reliability to satisfy the future demand of its customers.
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high-speed CMOS Double Data Rate Three Synchronous Dynamic Random Access Memory (DDRIIIL SDRAM) |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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June 29, 2022 |
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1.1 MB |
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