Single Event Effects (SEE) Testing of the ISL70001SRH Synchronous Buck Regulator
●Introduction
■The intense, heavy ion environment encountered in space applications can cause a variety of effects in electronic circuitry, including Single Event Upset (SEU), Single Event Transient (SET), Single Event Functional Interrupt (SEFI), Single Event Latchup (SEL), Single Event Burnout (SEB) and Single Event Gate Rupture (SEGR). SEE can lead to system-level performance issues including disruption, degradation and destruction. For predictable and reliable space system operation, individual electronic components should be characterized to determine their SEE response. This report discusses the results of SEE testing performed on the ISL70001SRH synchronous buck regulator.
●Product Description
■The ISL70001SRH is a monolithic synchronous buck regulator IC with integrated power MOSFETs. The device utilizes peak current-mode PWM control with integrated loop compensation and switches at a nominal frequency of 1MHz. It is fabricated on a 0.6μm BiCMOS junction isolated process optimized for power management applications. Available active devices include low voltage CMOS, high voltage DMOS and complementary bipolars. With this chip and a handful of external components, a complete synchronous buck DC-DC converter can be readily implemented. The converter accepts an input voltage ranging from 3V to 5.5V and provides a tightly regulated output voltage ranging from 0.8V to ~85% of the input voltage at output currents ranging from 0A to 6A. Typical applications include Point Of Load (POL) regulation for FPGAs, CPLDs, DSPs and microprocessors.
■The ISL70001SRH was hardened by design to achieve a Total Ionizing Dose (TID) rating of at least 100krads(Si) at the standard 50-300rad(Si)/s high dose rate as well as the standard < 10mrad(Si)/s low dose rate. Well known TID hardening methods were employed such as closed geometry NMOS devices to reduce leakage and optimized bias levels for bipolar devices to compensate for gain reduction. The ISL70001SRH was also hardened by design to a Linear Energy Transfer (LET) of 86.4 MeV/mg/cm². Various SEE hardening techniques were used including proper device sizing, filtering and special layout constraints. Triple Module Redundancy (TMR) plus a majority voter were used to harden the internal PWM control loop to SETs. Additional SET hardening was achieved by specifying or restricting the values of certain external components including bypass capacitors, feedback components and a pull-up resistor.
|
Synchronous Buck Regulator 、 monolithic synchronous buck regulator IC |
|
|
|
|
|
Test Report |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
February 2010 |
|
|
|
|
|
|
|
|
1.8 MB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
