Millimeter Resolution Reflectometry Over Two Kilometers
■Introduction
●Optical reflectometry techniques are commonly used to locate and identify components and faults in fiber-optic networks. As short-haul optical networks become more widely employed in avionics, ship-board and FTTx applications, higher spatial resolution measurements are needed for better link qualification and fault localization. Optical Frequency Domain Reflectometry (OFDR) has recently emerged as a measurement technique for high spatial resolution measurements of fiber optic components, assemblies, and short-haul networks. Comparable techniques such as Optical Time-Domain Reflectometry (OTDR) and Optical Low Coherence Reflectometry (OLCR) have constraints which limit their efficacy in some applications. OTDR for example, while an excellent technique for measurements over kilometers of fiber lengths, typically has a spatial resolution limit of tens of centimeters at best. This reduces its applicability to measurements of subassemblies or short-haul networks which may have elements that are closely spaced. While OLCR achieves a spatial resolution on the order of tens of microns, its measurement range is limited to a few meters at a time. This can make measurements of assemblies longer than a few meters tedious and time consuming.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2009/12/15 |
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1.3 MB |
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