Return Loss Measurement in the Presence of Variable Insertion: Loss Using Optical Frequency Domain Reflectometry

PublishTime：2022-05-26

●Abstract: The high spatial resolution and high sensitivity inherent to optical frequency domain reflectometery enables precise measurements of distributed insertion loss and return loss events. The ability to compensate return loss for variable insertion loss greatly adds to the accuracy and practicality of measurements. Further, the capability of measuring the Rayleigh backscatter internal to the instrument provides a stable power calibration artifact.
●Summary
▲We have demonstrated that an OFDR-based instrument is capable of producing repeatable RL measurements even for wildly different values of the insertion loss in close proximity to the reflection event. This capability greatly adds to the utility of the measurement, as the uncertainty due to the insertion loss at the connection to the instrument is eliminated. Additionally, we have shown that our instrument calibration procedure, which ties the RL values for a reference set of flat end face fiber reflectors to the Rayleigh backscatter level for a fiber segment inside the instrument, produces consistent results between instruments. Establishing the consistency of the precise level of the fiber Rayleigh scatter for fiber manufactured under very tight tolerances may eventually allow its use as a widely available, inexpensive, and stable return loss calibration artifact. These are preliminary results and are expected to improve as we continue to refine the calibration process for absolute return-loss measurement.

Brand of Product：	Advanced Photonix
Part#：	OBR 7022 、 OBR 7071 、 OBR 7078 、 OBR 7083 More Part#
Product Category：	OFDR-based instrument More
Application：	More
Data Type：	Application note & Design Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	2009/12/15
Version Number：
Data Encoding：
Data Size：	135 KB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 4 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits