Testing High Power Semiconductor Devices from Inception to Market
■For basic curve tracing measurements, perhaps a single source measure unit (SMU) instrument with Android-based curve tracer app is sufficient.
■When more meticulous curve tracing is required, a SMU instrument with semiconductor I-V characterization software may be the solution.
■For detailed on-state, off-state, or capacitance-voltage characterization, a full parametric curve tracer (PCT) allows both easy data acquisition and detailed parameter extraction.
■The flexible instrumentation used for curve tracing can also be configured in a racked system for simple functional test, process monitoring, or other higher volume characterization.
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User's Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2015/4/1 |
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1KW-60127-0 |
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3 MB |
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