Testing High Power Semiconductor Devices from Inception to Market

2022-05-25
●This e-guide examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle. From the early stages of designing a new power device to the point where it’s ready for market. Keithley’s flexible set of high power characterization tools are ideal for testing across the entire life cycle of a power device.
■For basic curve tracing measurements, perhaps a single source measure unit (SMU) instrument with Android-based curve tracer app is sufficient.
■When more meticulous curve tracing is required, a SMU instrument with semiconductor I-V characterization software may be the solution.
■For detailed on-state, off-state, or capacitance-voltage characterization, a full parametric curve tracer (PCT) allows both easy data acquisition and detailed parameter extraction.
■The flexible instrumentation used for curve tracing can also be configured in a racked system for simple functional test, process monitoring, or other higher volume characterization.

TEKTRONIX

High Power Semiconductorpower semiconductor

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English Chinese Chinese and English Japanese

2015/4/1

1KW-60127-0

3 MB

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