ADAR3000S (VPT RAD) HIGH DOSE RADIATION TEST REPORT (ADAR3000S-CSL)
■It is the responsibility of the Procuring Activity to screen products from Analog Devices, Inc. for compliance to Nuclear Hardness Critical Items (HCI) specifications.
■Warning:
●Analog Devices, Inc. does not recommend use of this data to qualify other product grades or process levels. Analog Devices, Inc. is not responsible and has no liability for any consequences, and all applicable Warranties are null and void if any Analog Devices product is modified in any way or used outside of normal environmental and operating conditions, including the parameters specified in the corresponding data sheet. Analog Devices, Inc. does not guarantee that wafer manufacturing is the same for all process levels.
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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October 2021 |
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ADAR3000S-CSL |
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1.5 MB |
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