EPC eGaN® Device Reliability Testing: Phase 12 RELIABILITY REPORT

PublishTime：2022-05-19

●The rapid adoption of Efficient Power Conversion’s (EPC) eGaN® devices in many diverse applications calls for continued accumulation of reliability statistics and research into the fundamental physics of failure in GaN devices. This Phase 12 reliability report adds to the growing knowledge base published in the first eleven reports [1-11] and covers several key new topics.
●Gallium nitride (GaN) power devices have been in volume production since March 2010 [12] and have established a remarkable field reliability record. This report presents the strategy used to achieve this track record that relied upon tests forcing devices to fail under a variety of conditions to create stronger and stronger products for the industry.

Brand of Product：	EPC
Part#：	EPC2212 、 EPC2034C More Part#
Product Category：	eGaN FET More
Application：	More
Data Type：	Test Report More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：	LGA;BGA
Language：	English Chinese Chinese and English Japanese
Date of Creation：	2022/3/31
Version Number：
Data Encoding：
Data Size：	7.7 MB

Data section preview(2pages)

- The full preview is over. If you want to read the whole 34 page document,please Sign in/Register -

Download

+1 Like
Add to Favorites

Recommend

Technical Resources

More>

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Integrated Circuits