Optical Backscatter Reflectometer 4600 User Guide
●Luna Technologies’ Optical Backscatter Reflectometer (OBR) is the industry’s first ultra-high resolution reflectometry device with backscatter-level sensitivity for interrogating components or systems. The OBR uses swept-wavelength coherent interferometry to measure minute reflections in an optical system as a function of length. This technique measures the full scalar response of the device under test (DUT), including both phase and amplitude information.
◆Locate loss events—Monitor backscatter levels to isolate 1 losses due to bends, crimps, bad splices, etc.
◆“Look inside” devices—Use high resolution and sensitivity to interrogate individual components within a subsystem.
◆Track Polarization—Track changes in the state-of-polariza- tion as light propagates through an optical network.
|
|
|
|
User's Guide |
|
|
|
|
Please see the document for details |
|
|
|
|
|
|
|
|
|
|
|
English Chinese Chinese and English Japanese |
|
|
2014/2/22 |
|
|
|
|
|
|
|
|
5.3 MB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.
Integrated Circuits
Discrete Components
Connectors & Structural Components
Assembly UnitModules & Accessories
Power Supplies & Power Modules
Electronic Materials
Instrumentation & Test Kit
Electrical Tools & Materials
Mechatronics
Processing & Customization
