N32G032K6Q7 Latch-up TESTING REPORT (S201028094)

2022-04-29
●Applicant/Department: Nations Technologies Inc.
●Product: N32G032K6Q7
●Case NO: S201028094
●Quantity: 9 ea
●Test Item: Latch-up (LU)
●Package/Pin Count: QFN32
●Application Date: 2020/11/10
●Date Finished: 2020/11/19
●Reference: JESD78E
●Temperature: 25 ± 5 °C
●Humidity: 55 ± 5%
●Test Instrument: MK2(SN0906253)
●Calibiration Due Date: 2020/09/02~2021/09/01
●Test Voltage: 1.5*VDDmax
●Trigger Current: ±100mA
●Failure Criteria: If absolute Inom is < 25 mA, then absolute Inom + 10 mA is used Or If absolute Inom is then > 1.4X absolute Inom is used
●File Name of Raw Data: N32G032K6Q7
●Latch up Testing Result: Minimum Pass Level = ±100mA ,1.5*VDDmax
●NOTE 1:
■ESD/latch-up test is employed as one of qualification tests for electronic products. However, the pass / fail results of this test can NOT be taken as go/no-go criteria for IC tape-out and mass production. Before and after ESD/latch-up test(s),complete parametric and functional testing (F/T) are essential for determining pass/fail of the tested products. (References: Page 9, AEC-Q100-003-Rev-E-2003; and Page 15, ESDA-JEDEC JS-001-2017).
●NOTE 2:
■MA-tek sample storage policy is 14 days after the test data delivery. Prolonged storage can be arranged per client's request.
●WE HEREBY CERTIFY THAT:
■The test(s) was/were conducted according to test conditions provided by customer. Testing was performed on calibrated and JEDEC-ESDA qualified ESD instruments. The quality and comprehensiveness of this test(s) were delivered by qualified personnel.

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2020/11/26

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S201028094

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