N32G030K6Q7/ N32G030K6Q7-1 ELECTRICAL OVER STRESS (EOS) TESTING REPORT (S210319134)
●Product: N32G030K6Q7/ N32G030K6Q7-1
●Case NO: S211018069
●Quantity: 3 ea
●Test Item: Electrical Over Stress (EOS)
●Package/Pin Count: QFN32
●Application Date: 2021/3/19
●Date Finished: 2021/3/30
●Reference: IEC 61000-4-5
●Temperature: 25 ± 5 °C
●Humidity: 55 ± 5%
●Test Instrument: EOS, TVS8/20TC
●Test Voltage: +8V
●Failure Criteria: compliance within 10% V+I envelope around REFERENCE I-V curve (pre-zap) and Customer FunctionTest.
●ESD Testing Result: Minimum Pass Level =+8V
●NOTE 1:
■MA-tek sample storage policy is 14 days after the test data delivery. Prolonged storage can be arranged per client's request.
●WE HEREBY CERTIFY THAT:
■The test(s) was/were conducted according to test conditions provided by customer. Testing was performed on calibrated and JEDEC-ESDA qualified ESD instruments. The quality and comprehensiveness of this test(s) were delivered by qualified personnel.
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Test Report |
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Please see the document for details |
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QFN32 |
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English Chinese Chinese and English Japanese |
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2021/3/30 |
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Ver:A |
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S210319134 |
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705 KB |
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