Structural Core Self-Test Library for S32K3xx - Product Brief

PublishTime：2022-04-26

The SCST (Structural Core Self-Test) Library is the software product used for the runtime detection of permanent HW faults in the MCU core. It contains test codes (atomic tests) that stimulates the MCU core submodules with the predefined test vectors and observes and evaluates the core logic response. It typically achieves 90% DC (Diagnostic Coverage). It targets various MCU core submodules, like:
●Data Path units (ALU, Multiplier, Divider),
●Load/Store unit,
●Forwarding logic,
●FPU
The details can be found in the Diagnostic Coverage Estimation document, which is a part of the delivery of each individual SCST product. Faults that are considered as safe (e.g. faults in the debugging logic) are not tested and are excluded from the DC calculation, see Figure 1: NXP's SCST Library content.

Brand of Product：	NXP
Part#：	S32K3xx More Part#
Product Category：	More
Application：	More
Data Type：	Datasheet More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
Package：
Language：	English Chinese Chinese and English Japanese
Date of Creation：	09/2021
Version Number：	Rev. 1
Data Encoding：
Data Size：	321 KB

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