CD4011B CMOS High Voltage Logic - Quad 2-Input NAND Gate
■ MIL-PRF-38534 CLASS K QUALIFICATION DATAPACK
■ Performed by Tandex Test Labs
● CONTENTS:
■ Certificate of Conformance
■ Process Flow Chart + Mechanical Test Results
■ Pre Burn-In Electrical Test Results at -55°C, 25°C, 125°C
■ Post Burn-In Electrical Test Results at -55°C, 25°C, 125°C
■ Scanning Electron Microscopy (SEM) analysis.
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2018/11/21 |
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6.9 MB |
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