x55 INTERNAL CALIBRATION ARCHITECTURE AND FAULT DETECTION Technical Note
■This document will provide an overview of the manner in which Hyperion instruments derive wavelength from measured optical channels and some of the strengths/advantages of its optical architecture.
■Covered topics
▲This documents will explain the nature and purpose of each optical reference channel in the Hyperion architecture, the manner in which data is computationally used to derive wavelength information, as well as additional operational benefits of this architecture is it relates to internal error detection.
■Scope
▲The methods and attributes described in this document are applicable to all instruments within the x55 product family, including si155, si255 and si255 EV models.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2016.02.28 |
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Revision 2016.02.28 |
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TN1381 |
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4 MB |
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