SCT4*** 6inch wafer MOSFET Reliability Test Result
●Sample standard:[Reliability level: 90%][Failure reliability level(λ1): 10%][C=0 decision] is adopted. And the number of samples is being made 22 in accordance with single sampling inspection plan with exponential distribution type based on MIL-STD-19500.
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Test Report |
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Please see the document for details |
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Through Hole Devices |
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English Chinese Chinese and English Japanese |
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2021.12 |
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Rev.A |
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614 KB |
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