Luna 6415 Lightwave Component Analyzer Data sheet
■The Luna 6415 utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance. Extremely high sensitivity and sampling resolution (20 μm) make the Luna 6415 an ideal testing tool for photonic integrated circuits (PICs) and silicon photonics. The Luna 6415 reduces the cost and complexity of test while increasing throughput by measuring RL, IL and length in reflection or transmission with a single instrument.
●KEY FEATURES
■Return loss (RL) and insertion loss (IL) analysis
■Trace distributed RL over length of optical path
■Spectral analysis of RL and IL
■Detect and precisely locate reflective events and measure path length
■Speed, resolution and accuracy for optimizing production test
▲20 μm sampling resolution
▲20 m measurement range
▲6 Hz scan/acquisition rate
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[ Spatial RL testing ][ Automated IL test ][ Automated IL analysis ][ Skew measurement ][ PLCs ][ waveguide devices ][ AWGs ][ ROADMs ][ Couplers ][ switches ][ beam splitters ] |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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04.30.19 |
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REV.1 |
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676 KB |
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