AT32F413 Series Reliability Test Report
●Reference Standard:JS-001-2017
●Test Item:ESD CDM Electrostatic Discharge Charged-Device Model
●Reference Standard:JS-002-2018
●Test Item:LU Latch-up
●Reference Standard:EIA/JESD78E
●Test Item:EFT Electrical Fast Transient
●Reference Standard:IEC 61000-4-4
●Test Item:HTOL High Temperature Operating Life
●Reference Standard:JESD22-A108-D
●Test Item:PRE-CON Pre-condition Test
●Reference Standard:JESD22-A113
●Test Item:TCT Temperature Cycle Test
●Reference Standard:JESD22-A104
●Test Item:PCT Pressure Cooker Test
●Reference Standard:JESD22-A102
●Test Item:HTST High Temperature Storage Test
●Reference Standard:JESD22-A103
|
|
|
|
Test Report |
|
|
|
Please see the document for details |
|
|
|
|
|
LQFP64;QFN48;LQFP48;QFN32 |
|
English Chinese Chinese and English Japanese |
|
05/20/2020 |
|
Rev.: 1.0 |
|
|
|
902 KB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.