EQ-77 LDLS™ High-Brightness, Long-Life, Broadband Laser-Driven Light Source
◆Researchers using light for imaging and analytical spectroscopy in a variety of applications in the life sciences and materials sciences need light sources capable of providing extreme high brightness and power across a broad wavelength range.
◆Traditionally, multiple lamps (Tungsten/Halogen, Xenon-arc, Deuterium) have been used to cover this broad spectral range. However, combining multiple lamps is costly and optically in-efficient, and the use of electrodes within these lamps limits their ability to achieve the high brightness or power needed for the most demanding applications. Furthermore, traditional electrode-driven light sources have short life, need to be changed frequently, and during their life the lamp output declines constantly.
◆To address this problem, Energetiq has developed a revolutionary single light source technology called the LDLS™ Laser-Driven Light Source that enables extreme high brightness, with a relatively flat spectrum, from 170nm through visible and beyond, combined with life time an order of magnitude longer than traditional lamps. The LDLS technology is fully embodied in the EQ-77 — an extremely bright and stable, compact CW broadband source that is specifically designed for critical spectroscopic and imaging applications.
◆Features and Benefits
■Radiance >40mW/mm².sr.nm (wavelength dependent)
- Fastest measurements
■Very low noise and excellent spatial stability
- Precise & repeatable results
■Dual beam output or higher-output Single-beam (using integrated Retro-reflector) for flexibility
- For optical flexibility
■Compact lamphouse with water-cooling and clean construction
- Long life and stability
■Extreme high brightness across broad spectrum
- UV-Vis-NIR (170nm – 2100nm)
■Electrodeless operation
- Long life and low cost of ownership
■Electronic optical output control
- Light attenuation
[ Semiconductor Metrology & Inspection ][ Monochromator Source ][ UV-Vis-NIR Spectroscopy ][ Photoemission Electron Microscopy (PEEM) ][ Materials Characterization ][ Advanced Imaging ][ Thin Film Measurements ] |
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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10/2017 |
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785 KB |
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