MTTF Prediction of AHB5614T8 InGaAs E-pHEMT Amplifiers

2021-09-08
In order to determine the MTTF of the amplifier, an accelerated aging test at an elevated temperature was carried out on randomly selected chips and a failure rate (FR) was obtained by a model given in MIL-HDBK-217E.

ASB

AHB5614T8

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InGaAs E-pHEMT Amplifiers

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Technical Documentation

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August 2021

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