Anritsu and SWISSto12 Material Measurement Solution
●Material measurements are integral when developing solutions in the millimeter-wave (mmWave) frequency range. PCB, antenna, radar measurement, and automotive/aeronautical engineers along with metrology and research institutes must characterize various materials to better understand their effects on how the electromagnetic waves travel through them (dielectric constant, tan delta, etc.). These material measurements are also becoming more critical for the Aerospace and Defense industry as well. Anritsu and SWISSto12 deliver a comprehensive material measurement solution ideal for lab, manufacturing, and university environments.
●Anritsu and SWISSto12 ：
■The Anritsu VectorStar™ and ShockLine™ vector network analyzers (VNAs) are compatible with the SWISSto12 MCK systems, and are ideal for active and passive material measurements. Combining the ground-breaking VectorStar VNA 70 kHz to 220 GHz single-sweep capability with the state-of-the-art SWISSto12 hardware and software technology, users now have a precise and accurate solution that can now measure any MUT from 25 GHz to 1.1 THz.
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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2020-05 |
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Rev. A |
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11410-01167 |
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532 KB |
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