AT32F403AVGT7/AT32F407VGT7 HBM/CDM/Latch-up Test Report (FWOE-19110463)
●Testing Laborary is accredited by:
◆IEC quality assessment system (IECQ):ISO/IECQ 17025
◆Certificate No. : IECQ-L ULTW 17.0001
●National Standards Authority of Ireland (DQS):ISO 9001:2015
◆Certificate No.: 50600164 QM15
●Taiwan Accreditation Foundation (TAF):ISO/IEC 17025
◆Certificate No.: 1709
●This report refers only - the specimen submitted - testing, and be invalid as separately used.
●Inom is the chip Icc current before test.
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Test Report |
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Please see the document for details |
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LQFP |
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English Chinese Chinese and English Japanese |
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12/03/2019 |
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Rev: 01 |
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FWOE-19110463 |
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349 KB |
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