EPC eGaN® Device Reliability Testing: Phase 12
●Gallium nitride (GaN) power devices have been in volume production since March 2010 [12] and have established a remarkable field reliability record. This report presents the strategy used to achieve this track record that relied upon tests forcing devices to fail under a variety of conditions to create stronger and stronger products for the industry.
EPC2212 、 EPC2203 、 EPC2051 、 EPC2202 、 EPC2206 、 EPC2201 、 EPC2045 、 EPC2053 、 EPC2034C 、 EPC2036 、 EPC2001 、 DUT3 、 EPC2001C 、 EPC9126 |
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Test Report |
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Please see the document for details |
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LGA;BGA |
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English Chinese Chinese and English Japanese |
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2021/07/01 |
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7.9 MB |
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