EPC eGaN® Device Reliability Testing: Phase 12

2021-07-19
●The rapid adoption of Efficient Power Conversion's (EPC) eGaN® devices in many diverse applications calls for continued accumulation of reliability statistics and research into the fundamental physics of failure in GaN devices. This Phase 12 reliability report adds to the growing knowledge base published in the first eleven reports [1-11] and covers several key new topics.
●Gallium nitride (GaN) power devices have been in volume production since March 2010 [12] and have established a remarkable field reliability record. This report presents the strategy used to achieve this track record that relied upon tests forcing devices to fail under a variety of conditions to create stronger and stronger products for the industry.

EPC

EPC2212EPC2203EPC2051EPC2202EPC2206EPC2201EPC2045EPC2053EPC2034CEPC2036EPC2001DUT3EPC2001CEPC9126

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eGaN Device

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Test Report

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LGA;BGA

English Chinese Chinese and English Japanese

2021/07/01

7.9 MB

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