Fast f-T-I-c Measurement Using the Keysight B2900A Series of SMUs
■Keysight B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse
■Keysight B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3A DC/10.5 A pulse
■Keysight B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse
■Keysight B2912A Precision SMU, 2ch, 10 fA resolution, 210 V, 3A DC/10.5 A pulse
●Introduction:
■The cutoff frequency (f-T) is an important parameter to understand the operating frequency range of a bipolar transistor. To measure f-T, a DC bias must be applied to place the transistor at the correct operating point while simultaneously using a network analyzer to measure its frequency characteristics.
■The Keysight Technologies, Inc. B2901/02/11/12A Precision Source/Measure Unit is a compact and cost-effective bench-top Source/Measure Unit (SMU) that supplies precise sourcing and measurement capability at a very reasonable price. In addition, the B2900A Series of SMUs supports enhanced trigger functions that enable each step of a bias sweep it performs to be synchronized with a frequency sweep performed by a network analyzer. These capabilities allow you to evaluate and plot parameters such as f-T versus I-c very quickly and efficiently.
■For all of these reasons, the B2900A Series of SMUs is the ideal bias source to use with network analyzers for the evaluation of transistor DC and RF characteristics. This technical overview explains the key features of the B2900A Series of SMUs in detail and shows how it can help to determine the f-T-I-c characteristics of bipolar transistors.
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B2900A 、 B2901A 、 B2902A 、 B2911A 、 B2912A 、 B2961A 、 B2962A |
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Supplier and Product Introduction |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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December 1, 2017 |
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5990-6895EN |
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1.2 MB |
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