Keysight Medalist i3070 Series 5 In‑Circuit Test System

2021-04-29
The Keysight Technologies, Inc. Medalist i3070 Series 5 In‑Circuit Test (ICT) system introduces a new infrastructure with 3 new Capabilities:
●The flexibility to incorporate external circuits to balance between ICT & functional testers and reduce investment on functional testers
●Wider range of power handling capabilities for today's high-powered products to reduce investment on power supply hardware
●Improved test throughput to increase production volumes, making more tester resources available

Keysight

i3070Series 5

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Part#

In‑Circuit Test SystemICT System

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Datasheet

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English Chinese Chinese and English Japanese

December 2, 2017

5990‑4344EN

4.1 MB

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