Keysight Medalist i3070 Series 5 In‑Circuit Test System
●The flexibility to incorporate external circuits to balance between ICT & functional testers and reduce investment on functional testers
●Wider range of power handling capabilities for today's high-powered products to reduce investment on power supply hardware
●Improved test throughput to increase production volumes, making more tester resources available
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Datasheet |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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December 2, 2017 |
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5990‑4344EN |
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4.1 MB |
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