N32G457QEL CDM ELECTROSTATIC DISCHARGE (ESD) TESTING REPORT(S200420065)
●Reference: ESDA/JEDEC JS-002-2018
●Temperature: 25 ± 5 °C ; Humidity: 55 ± 5%
●Test Voltage: ±1000V
●Failure Criteria: After testing, DUT no longer fulfills requirements of ± 30% voltage drift at ± 1uA reference current and compliance within 10% V+I envelope around REFERENCE I-V curve (pre-zap).
●ESD Testing Result: Minimum Pass Level = ±1000V
|
|
|
|
Test Report |
|
|
|
Please see the document for details |
|
|
|
|
|
LQFP128 |
|
English Chinese Chinese and English Japanese |
|
2020/7/5 |
|
Ver:A |
|
S200420065 |
|
710 KB |
- +1 Like
- Add to Favorites
Recommend
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.