Keysight Technologies Boundary-Scan Testing of Power/Ground Pins

PublishTime：2020-12-25

Most integrated circuits today possess large numbers of power and ground pins in addition to signal pins. Boundary-Scan technology will adequately test the signals, but in general does not address open defects on the power/ground pins. Some ICs could get at least partial coverage on some of these pins due to their internal power/ground distribution structure. Thus Boundary-Scan could be used to test, diagnose and claim coverage for these defects. What is needed is an extension to BSDL to support this capability.

Brand of Product：	Keysight
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Product Category：	More
Application：	More
Data Type：	Application note & Design Guide More
Safety & Environment Standards：	More
Operating Temperature：	Please see the document for details
Qualification Grade：	More
Qualification Approval：	More
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Language：	English Chinese Chinese and English Japanese
Date of Creation：	July 31, 2014
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Data Encoding：	5990-3303EN
Data Size：	514 KB

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Integrated Circuits