Power Semiconductor Device Temperature Characterization with Keysight U5855A and B1506A
Keysight B1506A Power Device Analyzer is superior in evaluating parameters of all power devices including insulated gate bipolar transistors (IGBTs). The B1506A has a wide range of capabilities that help it identify substandard devices under real operating conditions, including a wide voltage and current operating range (3 kV and 1500 A), a wide thermal test capability (-50 to +250 °C), advanced Source Monitor Unit (SMU) technology and sub-nA level current measurements capability.
The power semiconductor market has been experiencing rapid growth in recent years in the fields of power electric equipment, industrial equipment, automobiles and home appliances. Impervious to high voltage, high current and high power consumption, power devices are required to be highly reliable and to operate under harsh environmental conditions. The B1506A allows easy characterization of temperature dependency which can cause a device failure.
This application note describes a measurement method using the U5855A to evaluate temperature characterization of commercially available discrete power MOSFETs and IGBT modules, in tandem with electrical characterization with the B1506A.
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Supplier and Product Introduction |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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December 1, 2017 |
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5992-0070EN |
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2.4 MB |
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