B1505A Power Device Analyzer/Curve Tracer
2020-08-18
The Keysight Technologies, Inc. B1505A Power Device Analyzer/Curve Tracer is a single-box solution with next-generation curve tracer functionality that can accurately evaluate and characterize power devices at up to 10 kV and 1500 A. The B1505A is capable of handling all types of power device evaluation, with features that include a wide voltage and current range, fast pulsing capability (10 μs), μΩ level on-resistance measurement resolution and sub-pA level current measurement capability. In addition, an oscilloscope view permits visual verification of both current and voltage pulsed waveforms.
Two independent analog-to-digital (A/D) converters on each channel support a 2 μs sampling rate for accurate monitoring of the critical timings that can affect device behavior.
It can also perform fully automated capacitance measurements (such as Ciss, Coss and Crss) at high voltage biases (up to 3 kV). Moreover, it can evaluate gate charge (which is an important parameter for high frequency switching converter efficiency) at up to 3 kV as well. The B1505A with EasyEXPERT group+ software includes a curve tracer mode that combines familiar curve tracer functionality with the convenience of a PC-based instrument; this makes it easy for traditional curve-tracer users to become productive quickly. Module selector, device capacitance selector and Quick Test feature enable fully automated measurement on multiple parameters without the need to recable. Keysight EasyEXPERT group+ GUI based characterization software is available either on the B1505A’s embedded Windows 10 platform with 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. The net result is improved ease of use, better data analysis and simplified data management for the measurement of power devices and power circuitry.
Two independent analog-to-digital (A/D) converters on each channel support a 2 μs sampling rate for accurate monitoring of the critical timings that can affect device behavior.
It can also perform fully automated capacitance measurements (such as Ciss, Coss and Crss) at high voltage biases (up to 3 kV). Moreover, it can evaluate gate charge (which is an important parameter for high frequency switching converter efficiency) at up to 3 kV as well. The B1505A with EasyEXPERT group+ software includes a curve tracer mode that combines familiar curve tracer functionality with the convenience of a PC-based instrument; this makes it easy for traditional curve-tracer users to become productive quickly. Module selector, device capacitance selector and Quick Test feature enable fully automated measurement on multiple parameters without the need to recable. Keysight EasyEXPERT group+ GUI based characterization software is available either on the B1505A’s embedded Windows 10 platform with 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. The net result is improved ease of use, better data analysis and simplified data management for the measurement of power devices and power circuitry.
- +1 Like
- Add to Favorites
Recommend
More>
- Keysight Technologies and NCUOSC Establish Third-generation Semiconductor R&D and Test Open Laboratory
- Keysight Technologies Acquires Quantum Benchmar, Augmenting Keysight‘s Quantum Portfolio
- Keysight First to Gain OmniAir Qualified Test Equipment Status, Accelerating C-V2X Device Certification
- Keysight First to Gain GCF Approval of Cases for Validating 5G New Radio mmWave Devices in Standalone Mode
- Keysight Massively Parallel Board Test System Selected by LACROIX in Automotive Printed Circuit Board Manufacturing
- Keysight, TIM and JMA Wireless Join Forces to Showcase O-RAN Technology at Mobile World Congress 2021
- Keysight, Xilinx and Cisco Showcase Solutions that Support Smooth Migration from 4G LTE Networks to 5G Open RAN
- Keysight Unveils the First Media Access Control Security Test Solution for High Speed Ethernet
All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.