SMD XTAL CC/2018/B0184(SGS) Test Report

2023-05-08

◆以下测试样品系由申请厂商(安碁科技股份有限公司)所提供及确认:
■样品名称:SMD XTAL
◆测试需求:依据客户要求,进行高关注物质(SVHC)筛检
◆测试方法:参照SGS内部方法RSTS-EE-SVHC-007。由感应耦合等离子原子发射光谱仪、紫外光可见光谱仪、气相层析/质谱仪、液相层析/质谱仪、气相层析仪/火焰光度侦测器、液相层析/质谱仪/二极管数组侦测器、超高效能液相层析串联质谱仪进行分析
◆The following sample(s) was/were submitted and identified by/on behalf of the applicant (AKER TECHNOLOGY CO., LTD) as:
■Sample Description: SMD XTAL
◆Test Requested: As requested by client, SVHC Screening was performed
◆Test Method: SGS In-House method-RSTS-EE-SVHC-007. Analyzed by ICP-AES, UV-VIS, GC/MS, LC/MS, GC/FPD, LC/MS/DAD, UPLC-MSMS

AKER

SMD XTAL

More

More

Test Report

More

More

Please see the document for details

More

More

English Chinese Chinese and English Japanese

2018/11/28

CC/2018/B0184

703 KB

- The full preview is over. If you want to read the whole 17 page document,please Sign in/Register -
  • +1 Like
  • Add to Favorites

Recommend

All reproduced articles on this site are for the purpose of conveying more information and clearly indicate the source. If media or individuals who do not want to be reproduced can contact us, which will be deleted.

Contact Us

Email: