High-Speed Digital Test Module R&S TS-PHDT Technical Information

2022-07-05

●Product introduction
■The high-speed digital test module in the R&S Compact TSVP features excellent characteristics in a compact format at a low price. Due to the specifications and the price, the R&S TS-PHDT module can be used both in component and board testing. Its modularity and ability to synchronize with analog modules, e.g. PXI modules, makes mixed signal test possible. For higher channel numbers, several modules can be cascaded.
■The R&S TS-PHDT's high pattern rate, timing resolution, and wide level range cover all currently relevant logic families.
■Its huge memory capacity of 1.5 GByte makes it possible to create patterns of virtually unlimited length, as they are often generated by simulators. Several pattern sets can be downloaded once and be used again and again, thus eliminating the need for repeated time-consuming reload or download in production. In digital tests, the execution time is not defined by the actual tests but by the download and upload times. In production, an upload of measured data is not necessary at all. During execution, the hardware locally compares the measured values of the pin electronics – also at maximum pattern rate – with the nominal values in real time. Pass/fail, number of errors, failed channels, failed steps, and a short history are available in the error memory immediately after terminating a pattern set. Uploading larger data volumes is only necessary for debugging during program generation.
■The stimulus and measurement unit can be synchronized or used independently of each other. The pattern period and trigger delays can be set with a resolution of up to 12.5 ns; response delay for measurement and auxiliary clock with a resolution up to 3 ns. Clock signals for the device under test (DUT) can be directly generated by means of the auxiliary clock (formatting) and thus do not occupy several steps in the pattern memory for generating a pulse (return-to-zero, RTZ).

R&S

R&S TS-PHDTR&S TSVP1157.9704.02R&S CompactTSVPR&S TS-PCA31152.2518.02

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High-Speed Digital Test Module

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Datasheet

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English Chinese Chinese and English Japanese

28.02.2007

V0.4

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