Application Oriented Testing of Power Semiconductors in Quality Control
●Abstract: Due to the development of power semiconductor and converter technology a partially new characterization of today's semiconductor devices is required which takes into account the particular features of the devices and their typical and possible applications. This paper exemplarily derives which data are needed for IGBTs; it shows test methods to obtain them. Furtherly test equipment recently developed to perform these tests on fast switching devices is presented; its operational principles are explained. The equipment has been introduced into IGBT production which is shown by presenting measurement results obtained in regular volume tests.
●General:
■The recent test technology permits to optimize power semiconductor and converter industrie's product quality being a major factor of com-petitiveness. Testing is required for quality as-surance in all phases of production. This pa-per gives an insight how to economically and reliably test power semiconductors. Further-ly the knowledge of test and characterization techniques is also helpful during product devel-opment verifying a new layout when the gen-eralized information of specified data is trans-ferred to a particular application. Thus this pa-per is also intended to faciliate understanding at the interface between manufacturers and users of power semiconductors with the aim of pro-viding and assuring a characterization suitable for the state of the art applications.
■The draft for an international standard is related with the subject of this paper which points out new developments of tests and test equipment. It is not intended to repeat the con-tents of the standard. Instead the information given proceeds beyond the general knowledge which is used as a base-for example by ap-plying mainly the standardized symbols.
■For the sake of briefness the paper only deals with the characterization of the actual state of the power semiconductor component. Ques-tions like long term reliability-for example power cycling long term influence of envi-ronmental conditions-for example high tem-perature and humidity-are not subject of the paper although big effort is spent in the areas of development and production to assure long term stability and quality of power semiconduc-tor products satisfying any application.
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Application note & Design Guide |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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1997 |
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IXAN0047 |
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1.1 MB |
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