Harwin Test Report Summary HT04401 Latch Integrity Testing of L-Tek (M80 Series) Connectors
T5746 、 Z80-299 、 M80 Series |
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Test Report |
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Please see the document for details |
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English Chinese Chinese and English Japanese |
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22/10/2015 |
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Issue: 1 |
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HT04401 |
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858 KB |
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