Reliability Qualification Report
for
DDR4 SDRAM with Pb/Halogen Free
(1024M
×
8, 20nm SDRAM AS4C1G8D4A-62BCN)
Issued Date: July 27, 2023
Reliability Qualification Report
Confidential
July. 2023
CONTENTS
0. RELIABILITY TEST SUMMARY…………….……………...…..…………��.…..1
1. INTRODUCTION ............................................................................................ 2
2. PRODUCT INFORMATION ............................................................................ 2
3. RELIABILITY .................................................................................................. 2
3.1. Sample Preparation Flow ................................................................ ...... 2
3.2. Life Test ................................................................................................ 3
3.2.1. Test Flow ................................................................................... 3
3.2.2. Test Criteria ............................................................................... 3
3.2.3. Failure Rate Calculation and Test Result .................................. 4
3.3. Environmental Test ............................................................................... 6
3.3.1. Test Flow ................................................................................... 7
3.3.2. Test Condition and Time ........................................................... 7
3.3.3. Test Criteria and Result ........................................................... 10
3.4. ESD Test ............................................................................................. 10
3.5. Latch-Up Test ...................................................................................... 11
4. CONCLUSION .............................................................................................. 11
Reliability Qualification Report
Confidential
July. 2023