NR1600GK Series Reliability Test Report
Rev.01
Quality Grade : S
Package : DFN1212-6-GK
Test Condition
Pre-
Condition(*)
Duration
Failure size/
Sample size
Results Reference
125℃ ≦ Tj ≦ Tj max.
VDD = Voperation max.
None 1000h 0/22
PASS
JESD22-A108
JESD85
150℃ ≦ Ta ≦ Tj max. None 1000h 0/22 PASS JESD22-A103
Ta = 110℃ RH = 85%
VDD = Voperation max.
➀+➁ 264h 0/22
PASS
JESD22-A110
JESD22-A113
Ta = 110℃ RH = 85% ➀+➁ 264h 0/22 PASS
JESD22-A118
JESD22-A113
Ta = -65℃ ~ 150℃ ➀+➁ 500cycles 0/22 PASS
JESD22-A104
JESD22-A113
Reflow ➀ 3times 0/44 PASS
JESD22-A113
J-STD-020
C = 100pF R = 1.5kΩ
±2.0kV
None Once 0/3
PASS JS-001
±1.0kV None Once 0/3 PASS JS-002
±100mA
Class II
None Once 0/3 PASS JESD78
Criteria：The electrical characteristics prescribed in the individual specifications shall be satisfied.
(*) Pre-Condition
The Pre-Condition shall be performed before testing.
The baking condition(125℃,24h)
➀Ta = 85℃,RH = 85%,storage = 168h
➁Reflow soldering heat stress (3times)
Conclusion : This product passed reliability test.
MSL = LEVEL1
TC
Temp. Cycling
Resistance To Soldering Heat 1
ESD-HBM
Human Body Model
ESD-CDM(FI-CDM)
Charged Device Model
LU-I
I-Test
UHAST
Unbiased HAST
Test Item
HTOL
High Temp. Operating Life
HTSL
High Temp. Storage Life
HAST
Highly Accelerated Temp. and
Humidity Stress
Nisshinbo Micro Devices Inc.